发明名称 |
METHOD AND APPARATUS FOR CHEMICAL-MECHANICAL PLANARIZATION |
摘要 |
A method and apparatus for performing chemical-mechanical planarization (CMP) is disclosed, which in one embodiment includes a CMP tool for polishing a semiconductor wafer. The CMP tool includes a slurry mixture that has slurry beads. The slurry beads are formed of a polymer material. The slurry beads are used to remove summits and non-uniformities on the semiconductor wafer. In some embodiments the CMP tool includes a counter-face that replaces the polishing pad of a conventional CMP tool. In some embodiments the counter-face is made of polycarbonate. In another embodiment a slurry mixture for use with a CMP tool is disclosed. The slurry mixture includes slurry beads, where each of the slurry beads has a diameter of between 0.1 and 1000 microns, or in some embodiments a diameter of between 10 and 50 microns. |
申请公布号 |
US2011312182(A1) |
申请公布日期 |
2011.12.22 |
申请号 |
US201113225086 |
申请日期 |
2011.09.02 |
申请人 |
BORUCKI LEONARD JOHN;SAMPURNO YASA ADI;PHILIPOSSIAN ARA;ARACA, INC. |
发明人 |
BORUCKI LEONARD JOHN;SAMPURNO YASA ADI;PHILIPOSSIAN ARA |
分类号 |
H01L21/306;B24B27/00;C09G1/02;C09K3/14 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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