发明名称 Methods Of Manufacturing Three-Dimensional Semiconductor Devices
摘要 Methods of manufacturing three-dimensional semiconductor devices that may include forming a first spacer on a sidewall inside a first opening formed in a first stack structure, forming a sacrificial filling pattern on the spacer to fill the first opening, forming a second stack structure including a second opening exposing the sacrificial filling pattern on the first stack structure, forming a second spacer on a sidewall inside the second opening, removing the sacrificial filling pattern and removing the first spacer and the second spacer.
申请公布号 US2011312174(A1) 申请公布日期 2011.12.22
申请号 US201113165256 申请日期 2011.06.21
申请人 LEE JAEGOO;YOU BYUNGKWAN;PARK YOUNGWOO;SEOL KWANG SOO;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE JAEGOO;YOU BYUNGKWAN;PARK YOUNGWOO;SEOL KWANG SOO
分类号 H01L21/3205;H01L21/31 主分类号 H01L21/3205
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