发明名称 Capacitors Integrated with Metal Gate Formation
摘要 A semiconductor structure including a capacitor having increased capacitance and improved electrical performance is provided. The semiconductor structure includes a substrate and a MIM capacitor over the substrate. The MIM capacitor includes a bottom plate, an insulating layer over the bottom plate, and a top plate over the insulating layer. The semiconductor structure further includes a MOS device including a gate dielectric over the substrate and a metal-containing gate electrode free from polysilicon on the gate dielectric, wherein the metal-containing gate electrode is formed of a same material and has a same thickness as the bottom plate.
申请公布号 US2011309420(A1) 申请公布日期 2011.12.22
申请号 US201113215988 申请日期 2011.08.23
申请人 CHANG CHUNG-LONG;LU DAVID DING-CHUNG;CHEN CHIA-YI;WU I-LU;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHANG CHUNG-LONG;LU DAVID DING-CHUNG;CHEN CHIA-YI;WU I-LU
分类号 H01L27/07 主分类号 H01L27/07
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