| 摘要 |
<P>PROBLEM TO BE SOLVED: To appropriately detect the type of a via of a circuit to be evaluated with a small number of measurements. <P>SOLUTION: The disclosed technique, for example, is a measurement device 1 that applies a voltage to a via 6 of an information processing circuit 5. The measurement device 1 measures a size of a current flowing into the via to which the voltage is applied, and detects a type of the via to which the voltage is applied by using a relationship between the height of the voltage applied to the via and the size of the current flowing into the via. <P>COPYRIGHT: (C)2012,JPO&INPIT |
