| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a test procedure determination device capable of obtaining a test procedure for conducting a test in a short time. <P>SOLUTION: The test procedure determination device includes a parameter change condition storage part 3 which stores information representing a time needed to change parameter values of a plurality of parameters stored in a parameter value list storage part 1, a parameter value change order determination part 12 which calculates a minimum required time for making a round of possible parameter values for each of the plurality of parameters, and determines a change order of the parameter values of the respective parameters so as to minimize the total sum of times needed to change the parameter values based on a calculation result, and a parameter allocation part 13 which allocates the parameter values of the respective parameters to an orthogonal table 2 in the change order determined by the parameter value change order determination part 12. <P>COPYRIGHT: (C)2012,JPO&INPIT |
