A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.
申请公布号
US2011312229(A1)
申请公布日期
2011.12.22
申请号
US201113225141
申请日期
2011.09.02
申请人
HENRY DAVID W.;BEARD KILEY;THURSTON WILLIAM;FARRIS JASON W.;SMITH BRADLEY;INTERCONNECT DEVICES, INC.
发明人
HENRY DAVID W.;BEARD KILEY;THURSTON WILLIAM;FARRIS JASON W.;SMITH BRADLEY
