发明名称 Aberrometry measuring system for use in optical measuring system for determining refraction of eye, has imaging optics for imaging object plane of aberrometry measuring system in image plane of aberrometry measuring system
摘要 <p>The aberrometry measuring system (1) has imaging optics (30) for imaging an object plane (10) of an aberrometry measuring system in an image plane (20) of the aberrometry measuring system. A wavefront sensor (60) is provided with an entrance surface (61), which is arranged along an optical axis (OA) of the imaging optics. An independent claim is also included for an optical measuring system with a microscopy system.</p>
申请公布号 DE102010024606(A1) 申请公布日期 2011.12.22
申请号 DE20101024606 申请日期 2010.06.22
申请人 CARL ZEISS SURGICAL GMBH 发明人 SEESSELBERG, MARKUS, DR.;KUEBLER, CHRISTOPH, DIPL.-ING.;GROSS, HERBERT
分类号 A61F9/00;G01B9/00;G01J9/00 主分类号 A61F9/00
代理机构 代理人
主权项
地址