发明名称 SEQUENCE TEST APPARATUS AND SEQUENCE TEST METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a sequence test apparatus and a sequence test method capable of allowing a user to easily identify the latencies of terminals to be tested. <P>SOLUTION: A sequence test apparatus 40 is equipped with: a latency setting unit 41 for setting a reference latency; an actual latency acquisition unit 43 for acquiring the actual latencies of a node A10, a node B20, and a node C30 as the terminals to be tested; a difference calculation unit 45 which calculates a difference latency indicating a difference between the reference latency and an actual latency; a threshold setting unit 46 for setting a threshold for sorting the difference latency into a plurality of stages; a display condition setting unit 48 for setting a display condition for identifying and displaying the difference latency; and a display unit 50 for identifying and displaying the difference latency on the basis of the threshold. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011259076(A) 申请公布日期 2011.12.22
申请号 JP20100130038 申请日期 2010.06.07
申请人 ANRITSU CORP 发明人 IKETANI TOMOHITO;MORIYA MITSUHARU
分类号 H04B17/00;H04W24/06 主分类号 H04B17/00
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