发明名称 ELECTRIC CHARACTERISTIC INSPECTION APPARATUS AND ELECTRIC CHARACTERISTIC INSPECTION METHOD FOR ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an electric characteristic inspection apparatus and method capable of applying a uniform load to an object to be inspected and shortening an inspection time. <P>SOLUTION: The electric characteristic inspection apparatus includes a pressing mechanism for pressing the object to be inspected against an inspection apparatus with equal pressing force at a plurality of points and a conveying mechanism for sucking the object to be inspected in a direction where it is pressed by the pressing mechanism and holding and conveying it. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011257239(A) 申请公布日期 2011.12.22
申请号 JP20100131338 申请日期 2010.06.08
申请人 RENESAS ELECTRONICS CORP 发明人 SEKINO KENTARO
分类号 G01R31/26;H01R33/76 主分类号 G01R31/26
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