发明名称 CALIBRATION PATTERN FOR IMAGING DEVICE
摘要 A calibration pattern is provided with a central portion and a frame pattern provided outside thereof, the central portion being provided with a rectangular light area in the central portion of the calibration pattern. The frame pattern has a horizontal pattern and a vertical pattern, the horizontal pattern extending to two horizontal sides centering the central portion and alternately provided with a light area and a dark area at a predetermined interval different from an equal interval, the vertical pattern extending to two vertical sides centering the central portion and alternately provided with a light area and a dark area at a predetermined interval different from an equal interval. The horizontal pattern and the vertical pattern include edges, each being positioned equally distant from a predetermined position in the central portion to the two sides, and the edges have an identical change direction of a gray value.
申请公布号 US2011310256(A1) 申请公布日期 2011.12.22
申请号 US201113118809 申请日期 2011.05.31
申请人 SHISHIDO YUKO;MITUTOYO CORPORATION 发明人 SHISHIDO YUKO
分类号 H04N17/00 主分类号 H04N17/00
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