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发明名称
MICRO CONTACT PROBE FOR PROBE CARD COATED WITH CARBON NANO TUBE AND FEBRICATION METHOD THEREOF
摘要
<p>표면에 카본 나노 튜브가 코팅된 본 발명의 미세 접촉 프로브에 의하면, 프로브와 반도체 칩 사이의 접촉저항이 낮아지고 고주파 특성이 향상되어 더욱 정확한 측정이 가능하게 된다.</p>
申请公布号
KR101097217(B1)
申请公布日期
2011.12.22
申请号
KR20080091148
申请日期
2008.09.17
申请人
发明人
分类号
B82Y35/00;H01L21/66
主分类号
B82Y35/00
代理机构
代理人
主权项
地址
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