发明名称 Test handler for LED within the lead frame and test method thereof
摘要 PURPOSE: A test handler and method of an LED are provided to test an LED lead frame without a trim process for making bulk unit and to improve storability of the LED lead frame according to need. CONSTITUTION: A feeding unit(100) supplies an LED lead frame to a test work location. An LED chip is mounted in the LED lead frame. A test unit(200) is arranged in an area of the test work location. A probe which is partly touched with the LED lead frame tests the LED lead frame. A probe driving unit(230) which is connected to the probe drives the prove according to the LED lead frame. A probe head(231) supports the probe. A controller controls a motion of the test unit and the feeding unit. A linear motor transfers the probe head to a long side direction or a short side direction of the LED lead frame.
申请公布号 KR101095922(B1) 申请公布日期 2011.12.21
申请号 KR20100050947 申请日期 2010.05.31
申请人 发明人
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
代理机构 代理人
主权项
地址
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