发明名称 |
Die-warpage compensation structures for thinned-die devices, and methods of assembling same |
摘要 |
A back-side lamination (BSL) is applied after thinning a microelectronic die. The BSL is configured to be a thermal-expansion complementary structure to a metal wiring interconnect layout that is disposed on the active side of the microelectronic die.
|
申请公布号 |
US8080870(B2) |
申请公布日期 |
2011.12.20 |
申请号 |
US20090456638 |
申请日期 |
2009.06.18 |
申请人 |
HU CHUAN;INTEL CORPORATION |
发明人 |
HU CHUAN |
分类号 |
H01L23/34;H01L23/10 |
主分类号 |
H01L23/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|