发明名称 Die-warpage compensation structures for thinned-die devices, and methods of assembling same
摘要 A back-side lamination (BSL) is applied after thinning a microelectronic die. The BSL is configured to be a thermal-expansion complementary structure to a metal wiring interconnect layout that is disposed on the active side of the microelectronic die.
申请公布号 US8080870(B2) 申请公布日期 2011.12.20
申请号 US20090456638 申请日期 2009.06.18
申请人 HU CHUAN;INTEL CORPORATION 发明人 HU CHUAN
分类号 H01L23/34;H01L23/10 主分类号 H01L23/34
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