发明名称 METHOD OF MANUFACTURING A VERTICAL TYPE SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A vertical type semiconductor device manufacturing method is provided to use a material with a small stress variation of a film by heat as a sacrificial film and inter-layer insulating film, thereby reducing lifting or crack fault generation of the film due to stress. CONSTITUTION: A pad insulating film(102) is arranged on a substrate(100). The pad insulating film is arranged by thermal oxidation of the substrate. A sacrificial film(104) is arranged on the pad insulating film. An inter-layer insulating film(106) is arranged on the sacrificial film. The sacrificial film is arranged with a material which has an etching selection ratio with the inter-layer insulating film.</p>
申请公布号 KR20110136273(A) 申请公布日期 2011.12.21
申请号 KR20100056152 申请日期 2010.06.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JIN GYUN;LEE, BO YOUNG;HWANG, KI HYUN;HONG, EUN KEE;CHOI, JONG WAN
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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