SCAN FLIP-FLOP CIRCUIT AND SCAN TEST CIRCUIT INCLUDING THE SAME

摘要

PURPOSE: A scan flip-flop circuit and a scan test circuit including the same are provided to reduce loss in time and power through a different path, thereby improving test efficiency. CONSTITUTION: A scan flip-flop circuit(1000) comprises an input part(100) and an output part(200). The input part receives a clock signal, a data input signal, a scan input signal, and a scan enable signal. The input part selects the data input signal or scan input signal according to a operation mode of the scan flip-flop circuit. The input part provides an internal signal based on the selected signal in the input part. The input part selects the data input signal in a first operation mode. The input part provides the internal signal based on the data input signal. The input part provides the internal signal based on the scan input signal by selecting the scan input signal in a second operation mode.