发明名称 SEMICONDUCTOR WAFER HAVING A ALIGNMENT MARK FOR WAFER BONDING AND PROCESSING METHOD THEREOF
摘要 PURPOSE: A semiconductor wafer having a alignment mark for a wafer bonding and a processing method thereof are provided to align the position of an individual semiconductor wafer by bonding a wafer up and down. CONSTITUTION: In a semiconductor wafer having a alignment mark for a wafer bonding and a processing method thereof, an individual semiconductor chip(102) is divided by a scribe line within a semiconductor wafer(100A). A plurality of via holes(104) is formed in one end of the semiconductor wafer. An alignment mark(106A) is formed in a region in which the via hole is formed. The alignment mark is formed in the semiconductor wafer through the via hole.
申请公布号 KR20110135104(A) 申请公布日期 2011.12.16
申请号 KR20100054837 申请日期 2010.06.10
申请人 STS SEMICONDUCTOR & TELECOMMUNICATIONS CO., LTD. 发明人 CHUN, JUNG HWAN
分类号 H01L23/12 主分类号 H01L23/12
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