发明名称 |
SEMICONDUCTOR WAFER HAVING A ALIGNMENT MARK FOR WAFER BONDING AND PROCESSING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor wafer having a alignment mark for a wafer bonding and a processing method thereof are provided to align the position of an individual semiconductor wafer by bonding a wafer up and down. CONSTITUTION: In a semiconductor wafer having a alignment mark for a wafer bonding and a processing method thereof, an individual semiconductor chip(102) is divided by a scribe line within a semiconductor wafer(100A). A plurality of via holes(104) is formed in one end of the semiconductor wafer. An alignment mark(106A) is formed in a region in which the via hole is formed. The alignment mark is formed in the semiconductor wafer through the via hole. |
申请公布号 |
KR20110135104(A) |
申请公布日期 |
2011.12.16 |
申请号 |
KR20100054837 |
申请日期 |
2010.06.10 |
申请人 |
STS SEMICONDUCTOR & TELECOMMUNICATIONS CO., LTD. |
发明人 |
CHUN, JUNG HWAN |
分类号 |
H01L23/12 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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