发明名称 SPECTROMETER
摘要 <P>PROBLEM TO BE SOLVED: To improve a measurement accuracy of a spectrometer, for example, without using an expensive optical band pass filter. <P>SOLUTION: The spectrometer comprises: an optical band pass filter part 300 having a first wavelength region to a n-th wavelength region (n is an integer of 2 or more) as a spectral band; a light receiving part 400; a correction operation part 500; and a signal processing part 600. When the m-th wavelength region (1&ge;m&ge;n) is defined as a wavelength region of interest and a k-th wavelength region (k&ne;m and 1&ge;k&ge;n) except a m-th wavelength region is defined as a wavelength region of no interest, the optical band pass filter part functions as a m-th band pass filter corresponding to the m-th wavelength region and a k-th band pass filter corresponding to the k-th wavelength region. The correction operation part 500 comprises: a noise estimation unit 508 that estimates an amount of noise component of each wavelength region in the k-th wavelength region included in a light receiving signal of interest that is obtained by receiving transmitted light or reflected light of the m-th band pass filter corresponding to the m-th wavelength region, by the light receiving part; and a noise removal correction part 510 that determines a correction light receiving signal corrected by subtracting an estimated total amount of noise component of each wavelength region from the light receiving signal of interest. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011252749(A) 申请公布日期 2011.12.15
申请号 JP20100125717 申请日期 2010.06.01
申请人 SEIKO EPSON CORP 发明人 FUNAMOTO TATSUAKI
分类号 G01J3/26 主分类号 G01J3/26
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