发明名称 ABNORMALITY INSPECTION SYSTEM OF COOLING UNIT IN ELECTRONIC CIRCUIT
摘要 <P>PROBLEM TO BE SOLVED: To provide an abnormality inspection system capable of surely inspecting abnormality, such as a mounting failure and a malfunction, of a cooling unit in an electronic circuit with a simple method. <P>SOLUTION: An abnormality inspection system of a cooling unit in an electronic circuit 1 provided with a heating component 2 and a cooling unit 3 for cooling the heating component includes: a component temperature detection part 4 for detecting a temperature of the heating component 2; a consumption current detection part 5 for detecting a consumption current in the heating component 2; and an abnormality determination part 7 for determining the abnormality of the cooling unit 3 based on the component temperature detected by the component temperature detection part 4 and the consumption current detected by the consumption current detection part 5. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011253887(A) 申请公布日期 2011.12.15
申请号 JP20100125904 申请日期 2010.06.01
申请人 FANUC LTD 发明人 AOYAMA KAZUNARI;NAKAMURA MINORU;KOIZUMI AKIRA;KOMATSU TAKAAKI
分类号 H01L23/34;H01L23/58;H05K7/20 主分类号 H01L23/34
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