发明名称 APPARATUS FOR MEASURING SURFACE MISALIGNMENT AND ANGULAR MISALIGNMENT
摘要 Through a first diffraction grating, two conical fluxes different in wavefront propagation angle relative to its optical axis are applied to a first surface. Through a second diffraction grating, two conical fluxes different in wavefront propagation angle relative to its optical axis are applied to a second surface. Two sets of interference fringes formed by the fluxes reflected from the first surface and a reference beam are analyzed to obtain surface misalignment and angular misalignment of the first surface relative to the optical axis. Similarly, two sets of interference fringes formed by the fluxes reflected from the second surface and the reference beam are analyzed to obtain surface misalignment and angular misalignment of the second surface relative to the optical axis. Surface misalignment and angular misalignment of a sample lens are obtained from the measurement results of the first and second surfaces.
申请公布号 US2011304855(A1) 申请公布日期 2011.12.15
申请号 US201113157791 申请日期 2011.06.10
申请人 UEKI NOBUAKI;KANDA HIDEO;FUJIFILM CORPORATION 发明人 UEKI NOBUAKI;KANDA HIDEO
分类号 G01B11/14 主分类号 G01B11/14
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