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发明名称
VERFAHREN ZUR MUSTERUNG EINES DETEKTORGLASES UND EIN HALBLEITER-DETEKTOR MIT EINEM GEMUSTERTEN GLAS
摘要
申请公布号
AT536637(T)
申请公布日期
2011.12.15
申请号
AT20080167085T
申请日期
2008.10.21
申请人
OXFORD INSTRUMENTS ANALYTICAL OY
发明人
SIPILAE, HEIKKI;ANDERSSON, HANS;NENONEN, SEPPO;KALLIOPUSKA, JUHA
分类号
H01L31/18;H01L31/103
主分类号
H01L31/18
代理机构
代理人
主权项
地址
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