| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device including a test signal generation circuit for resetting a test circuit where a test mode is erroneously set when power is supplied. <P>SOLUTION: A test signal generation circuit 100 shifts a test enable signal TESTE from an L level to an H level so as to activate a test circuit, and shifts the test enable signal TESTE from an H level to an L level so as to deactivate the test circuit. When a test mode entry signal ENTESTB is shifted from an H level to an L level, the test enable signal TESTE is shifted from an L level to an H level. When the test mode entry signal ENTESTB is shifted to an H level after a predetermined prescribed period elapses after the test enable signal TESTE is shifted to an H level, the test enable signal TESTE is shifted from an H level to an L level. <P>COPYRIGHT: (C)2012,JPO&INPIT |
