发明名称 SINGLE GATE FINFET STRUCTURE AND METHOD FOR MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a novel FinFET structure and a method for manufacturing the same. <P>SOLUTION: A single-gate FinFET structure 100 includes an active fin structure having two enlarged head portions and two respective tapered neck portions that connect the enlarged head portions with an underlying ultra-thin body. Two source/drain regions 102, 104 are doped in the two enlarged head portions respectively. An insulation region 26 is interposed between the two source/drain regions. A trench isolation structure 24 is disposed at one side of the tuning fork-shaped fin structure. A single-sided sidewall gate electrode 12b is disposed on a vertical sidewall of the active fin structure opposite to the trench isolation structure in the active fin structure. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011254062(A) 申请公布日期 2011.12.15
申请号 JP20110020934 申请日期 2011.02.02
申请人 NANYA TECHNOLOGY CORP 发明人 RENN SHING-HWA
分类号 H01L21/8242;H01L21/76;H01L27/108;H01L29/78;H01L29/786 主分类号 H01L21/8242
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