发明名称 |
METHOD FOR PRODUCING EPITAXIAL WAFER |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for producing an epitaxial wafer having good forward voltage by reducing, than before, the failure of the forward voltage (Vf) generated by Si mixed when a p-type layer is formed. <P>SOLUTION: The method for producing the epitaxial wafer at least includes a step of epitaxially growing a p-type layer by hydride vapor phase epitaxy (HVPE) on a substrate of a compound semiconductor, wherein nitrogen gas is passed in an HVPE furnace when the temperature of the substrate is raised before starting the epitaxial growth of the p-type layer. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011251877(A) |
申请公布日期 |
2011.12.15 |
申请号 |
JP20100127003 |
申请日期 |
2010.06.02 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
SHINOHARA MASAYUKI;NISHIYAMA KAZUYOSHI |
分类号 |
C30B29/44;C23C16/30;C30B25/02;H01L21/205;H01L33/30 |
主分类号 |
C30B29/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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