发明名称 POLISHING LIQUID FOR CMP AND POLISHING METHOD USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing liquid for CMP with high versatility, which is less dependent on a substrate surface condition compared to conventional polishing liquids while capable of achieving a sufficiently high polishing speed for silicon oxide films, and to provide a polishing method using the polishing liquid for CMP. <P>SOLUTION: The polishing liquid for CMP of the present invention includes: abrasive grains; a first additive; and water. The first additive is at least one of 1,2-benzoisothiazole-3(2H)-one and 2-aminothiazole. The polishing method of the present invention is a polishing method for a substrate having a silicon oxide film on the surface, and includes a step of polishing the silicon oxide film with a polishing pad while the polishing liquid for CMP is supplied between the silicon oxide film and the polishing pad. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011254067(A) 申请公布日期 2011.12.15
申请号 JP20110093091 申请日期 2011.04.19
申请人 HITACHI CHEM CO LTD 发明人 SATO HIDEKAZU;NOBE SHIGERU;OTA MUNEHIRO;HANANO MASAYUKI;YOSHIKAWA SHIGERU
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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