Test Apparatus in Semiconductor Integrated Circuit,申请号KR20090070193-传众专利搜索

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发明名称	Test Apparatus in Semiconductor Integrated Circuit
摘要
申请公布号	KR101094903(B1)	申请公布日期	2011.12.15
申请号	KR20090070193	申请日期	2009.07.30
申请人		发明人
分类号	G01R31/3183;G01R31/306	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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