| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide, for use in an electrically detected electron spin resonance process, a sample holder structure that enables current noise attributable to contact resistance or the like to be reduced and a manufacturing method for the same. <P>SOLUTION: On the surface of a sample holder for use in an electrically detected electron spin resonance apparatus, two electric wires 201 are formed; at the tip of the sample holder, an electrode pad 203 for fixing the sample is formed and connected to one of the electric wires 201; the other of the electric wires 201 has a metal member 210, to the tip of which a spring probe 211 is connected; and the spring probe 211 secures satisfactory electrical connection by generating a compressive force on a sample 205. <P>COPYRIGHT: (C)2012,JPO&INPIT |
