发明名称 |
INSPECTION DEVICE FOR SECONDARY BATTERY, INSPECTION METHOD FOR THE SAME, AND PRODUCTION METHOD FOR THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspection device and the like for a secondary battery allowing grasping of a state of SEI film of a secondary battery, particularly a lithium ion secondary battery. <P>SOLUTION: Impedance acquisition means acquires impedance of a secondary battery. Determination means determines a state of SEI film of the secondary battery based on the impedance acquired by the impedance acquisition means. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011252930(A) |
申请公布日期 |
2011.12.15 |
申请号 |
JP20110197065 |
申请日期 |
2011.09.09 |
申请人 |
YOKOGAWA ELECTRIC CORP |
发明人 |
AKUTSU TOMOMI;YAMAZAKI DAISUKE;TOMOSADA NOBUHIRO;KIMURA ATSUSHI;KAWANO MAKOTO;TORAI SOICHIRO;YANO TETSUO |
分类号 |
G01R31/36;H01M10/42;H01M10/48 |
主分类号 |
G01R31/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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