发明名称 Scheme to Enable Robust Integration of Band Edge Devices and Alternatives Channels
摘要 A method of forming a semiconductor device includes forming a buried oxide (BOX) layer on a semiconductor substrate, forming a silicon-on-insulator (SOI) layer on the BOX layer, depositing a hard mask including one of silicon, a nitride, and a metal oxide on the SOI layer, removing the hard mask from a first region of the semiconductor device, performing a cleaning process on the semiconductor device, wherein the hard mask is not removed from a second region of the semiconductor device by the cleaning process, epitaxially growing a semiconductor material in the first region of the semiconductor device, and removing the hard mask from the second region of the semiconductor device.
申请公布号 US2011303981(A1) 申请公布日期 2011.12.15
申请号 US20100797431 申请日期 2010.06.09
申请人 EDGE LISA F.;JAGANNATHAN HEMANTH;HARAN BALA SUBRAMANIAN;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 EDGE LISA F.;JAGANNATHAN HEMANTH;HARAN BALA SUBRAMANIAN
分类号 H01L27/12;H01L21/20 主分类号 H01L27/12
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