| 摘要 |
A technique and apparatus for detection of infrared radiation emitted from a taggant material sample following the excitation of the sample are described. The decay time of the radiation is a function of the particular taggant being used and so, if the decay characteristic or signature is accurately measured, the particular taggant can be accurately identified. The apparatus comprises an electronic controller (10), a pair (12) of illuminating light-emitting diodes, a photo-detector (14), a first amplifier (16), a three-way sampling switch (18), filter/stores (20)(a-c), second amplifiers (22)(a-c) and an output display (26). The infrared emission is excited by repeatedly illuminating the material for a period of microseconds every few milliseconds using a very intense source of infrared light. This light is supplied by the pair of 940 nm, light-emitting diodes (12). Once this light source has been turned off, the sample continues radiating infrared light for a few milliseconds. The emission is detected by photo-detector (14) that is only sensitive to infrared light in the 800 to 1000 nm waveband. This helps to reject interference from visible light sources. |
