发明名称 Semiconductor memory device and method of fabricating the same
摘要 A semiconductor memory includes a memory cell array area provided with first and second memory cells and having a first active area and a first element isolation area constituting a line & space structure, and having a floating gate electrode and a control gate electrode in the first active area, a word line contact area adjacent to the memory cell array area and having a second active area, first and second word lines with a metal silicide structure, functioning respectively as the control gate electrodes of the first and second memory cells and arranged to straddle the memory cell array area and the word line contact area. A dummy gate electrode is arranged just below the first and second word lines in the second active area.
申请公布号 US8076205(B2) 申请公布日期 2011.12.13
申请号 US201113081248 申请日期 2011.04.06
申请人 MAEKAWA HIDEAKI;KABUSHIKI KAISHA TOSHIBA 发明人 MAEKAWA HIDEAKI
分类号 H01L21/336 主分类号 H01L21/336
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