发明名称 Monolithic power monitor and wavelength detector
摘要 Monolithic single and/or dual detector structures are fabricated on the emitting surface of a VCSEL and/or on a lens or glass substrate configured to be positioned along the axis of emission of an optical light source. Each monolithic detector structure includes one or two PIN detectors fabricated from amorphous silicon germanium with carbon doping or amorphous germanium with hydrogen doping. The monolithic detectors may additionally include various metallization layers, buffer layers, and/or anti-reflective coatings. The monolithic detectors can be grown on 1550 NM VCSELs used in optical transmitters, including lasers with managed chirp and TOSA modules, to reduce power and real estate requirements of the optical transmitters, enabling the optical transmitters to be implemented in long-reach SFP+ transceivers.
申请公布号 US8078063(B2) 申请公布日期 2011.12.13
申请号 US20080026368 申请日期 2008.02.05
申请人 DAGHIGHIAN HENRY M.;MCCALLION KEVIN J.;FINISAR CORPORATION 发明人 DAGHIGHIAN HENRY M.;MCCALLION KEVIN J.
分类号 H04B10/06 主分类号 H04B10/06
代理机构 代理人
主权项
地址