发明名称 Method of manufacturing a semiconductor device
摘要 A manufacturing method of a semiconductor device including a protecting element with a p-n junction which can be formed in the same process as that of a p-channel junction FET while the junction FET is formed in simple manufacturing process is provided. In the method of manufacturing semiconductor device composed of compound semiconductor having a p-channel FET and protective element, an n-type channel layer 2, n+-type contact layer 3, n-type semiconductor layer 5, p-type channel layer 7, p+-type contact layer 8 are laminated on a substrate 1 to form a semiconductor laminate portion 10. A portion of the semiconductor laminate portion 10 is removed by etching to expose the n+-type contact layer 3 and gate electrode 13 of a junction p-channel FET 22 is formed on the surface of the exposed n+-type contact layer 3. A protective element 23 is formed by a portion of the semiconductor 10.
申请公布号 US8076188(B2) 申请公布日期 2011.12.13
申请号 US20090568466 申请日期 2009.09.28
申请人 MIYAKOSHI KAORU;NEW JAPAN RADIO CO., LTD. 发明人 MIYAKOSHI KAORU
分类号 H01L21/338 主分类号 H01L21/338
代理机构 代理人
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