发明名称 Method of fabricating metal oxide semiconductor transistor
摘要 A method of fabricating a MOS transistor is disclosed. The method includes the steps of: providing a semiconductor substrate; forming at least a gate on the semiconductor substrate; forming a protective layer on the semiconductor substrate, and the protective layer covering the surface of the gate; forming at least a recess within the semiconductor substrate adjacent to the gate; forming an epitaxial layer in the recess, wherein the top surface of the epitaxial layer is above the surface of the semiconductor substrate; and forming a spacer on the sidewall of the gate and on a portion of the epitaxial layer, wherein a contact surface of the epitaxial layer and the spacer is above the surface of the semiconductor substrate.
申请公布号 US8076194(B2) 申请公布日期 2011.12.13
申请号 US20100781826 申请日期 2010.05.18
申请人 TSENG CHU-YIN;HSU SHIH-CHIEH;WU CHIH-CHIANG;TING SHYH-FANN;CHENG PO-LUN;CHEN HSUAN-HSU;UNITED MICROELECTRONICS CORP. 发明人 TSENG CHU-YIN;HSU SHIH-CHIEH;WU CHIH-CHIANG;TING SHYH-FANN;CHENG PO-LUN;CHEN HSUAN-HSU
分类号 H01L21/8238 主分类号 H01L21/8238
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