发明名称 |
Method of laser annealing semiconductor layer and semiconductor devices produced thereby |
摘要 |
A laser annealing method includes forming a nitrogen-doped layer on a semiconductor layer, the nitrogen-doped layer having a nitrogen concentration of at least 3×1020 atoms/cc, irradiating a first area of the nitrogen-doped layer in a low oxygen environment with a laser beam and irradiating a second area of the nitrogen-doped layer in a low oxygen environment with a laser beam, a part of the second area overlapping with the first area.
|
申请公布号 |
US8076186(B2) |
申请公布日期 |
2011.12.13 |
申请号 |
US20090419588 |
申请日期 |
2009.04.07 |
申请人 |
LIM KIAN KIAT;NAKAMURA ATSUSHI;TAN KAI PHENG;LIM ENG SOON;FU POH LING;KAMIMURA TAKAAKI;TOSHIBA MATSUSHITA DISPLAY TECHNOLOGY CO., LTD. |
发明人 |
LIM KIAN KIAT;NAKAMURA ATSUSHI;TAN KAI PHENG;LIM ENG SOON;FU POH LING;KAMIMURA TAKAAKI |
分类号 |
H01L21/84;H01L21/20;H01L21/265;H01L21/336;H01L29/786 |
主分类号 |
H01L21/84 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|