发明名称 Electro-method and apparatus for improved chemical mechanical planarization pad with uniform polish performance
摘要 A polishing pad includes a guide plate having a plurality of holes therein and being affixed to a compressible under-layer; and a plurality of conducting polishing elements each affixed to the compressible under-layer and passing through a sealed contact with a proton exchange membrane and corresponding hole in the guide plate so as to be maintained in a substantially vertical orientation with respect to the compressible under-layer but being translatable in a vertical direction with respect to the guide plate. The polishing pad may also include a slurry distribution material fastened to the guide plate by an adhesive. Pad wear sensors may also be provided in the polishing pad.
申请公布号 US8075745(B2) 申请公布日期 2011.12.13
申请号 US20050576942 申请日期 2005.10.05
申请人 BAJAJ RAJEEV;SEMIQUEST INC. 发明人 BAJAJ RAJEEV
分类号 C25F7/00 主分类号 C25F7/00
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