发明名称 |
CIRCUIT BOARD AND APPARATUS FOR CHECKING THE DEFECT OF CIRCUIT BOARD |
摘要 |
PURPOSE: A circuit board and a failure processing apparatus thereof are provided to improve detection accuracy of a bad cell by printing a short wiring on a major wiring of the bad cell using an ink-jet printer method. CONSTITUTION: A bad cell detection unit(210) detects a bad cell among a plurality of cells. The bad cell detection unit creates coordinate data of the bad cell. A bad cell display unit(230) shorts one and more bad cells at a wiring pattern of the bad cell by printing ink with an ink-jet printer method based on the coordinate data of the bad cell. The ink uses different ink with the wiring pattern of the bad cell. A bad cell determination unit(250) classifies a final bad cell about the bad cell in which ink is printed.
|
申请公布号 |
KR20110133157(A) |
申请公布日期 |
2011.12.12 |
申请号 |
KR20100052732 |
申请日期 |
2010.06.04 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
CHO, SU HWAN;KIM, SUNG EUN;JEONG, KYOUNG JIN |
分类号 |
H05K13/08;H05K3/00;H05K3/10 |
主分类号 |
H05K13/08 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|