| 摘要 |
Disclosed is a device for measuring the mechanical and electrical properties of nano test tubes, nanorods and nanotubes, which operation is based on the principle of differential thermal expansion in the inner section of the micro device, which is made of a material with a high expansion coefficient, while the outer portion thereof is made of a second material with a low expansion coefficient, which is useful to be thermally anchored to the first section. The aforementioned characteristic allows a traction force to be generated over a nano test tube fixed and axially oriented between the support and the active bar of the present micro device which are located at the central portion thereof. The operation of the micro device requires to be slightly heated using a heating stage of the standard type for transmission electron microscopes (TEM). The geometry of the device is designed to be matched with the commercial stages for microscopes currently available on the market. In addition, th e device uses the nano test tubes welded to the device as an electrode. For leading the connexions outside the microscope, an insulator such as SiO2, is deposited, and over said insulator being deposited the metal that will carry out the connexion outside the TEM microscope. In this form, the invention is useful for measuring the electric conductivity during the mechanical deformation process.
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