发明名称 |
STRUTTURA DI RILEVAMENTO DELL'ALLINEAMENTO DI UNA SONDA ATTA A TESTARE CIRCUITI INTEGRATI |
摘要 |
<p>A sensing structure for use in testing integrated circuits on a substrate. The sensing structure includes at least two sensing regions connectable to a probe and at least one first sensing element. Each of the at least one first sensing elements is directly connected to two sensing regions such that for each sensing region a different value of an electrical parameter is measurable between the sensing region and a first reference potential so as to reliably determine a drift direction of a probe.</p> |
申请公布号 |
ITVI20100159(A1) |
申请公布日期 |
2011.12.11 |
申请号 |
IT2010VI00159 |
申请日期 |
2010.06.10 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
PAGANI ALBERTO |
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