发明名称 METHOD FOR CRYSTALLIZATION OF SILICON LAYER AND METHOD FOR FORMATION OF THIN FILM TRANSISTOR USING THE SAME
摘要 PURPOSE: A method for crystallization of a silicon layer and a method for forming a thin film transistor using the method for crystallization are provided to steadily form catalyst metal of a trace amount by changing the surface of an amorphous silicon layer into hydrophobic. CONSTITUTION: An amorphous silicon layer is formed on substrate(S110). The surface of the amorphous silicon is executed a hydrophobic treatment. A catalyst metal is formed on the amorphous silicon layer(S130). The amorphous silicon layer which forms the catalyst metal is crystallized to a polycrystalline silicon layer by a thermal process(S140). The hydrophobic treatment is processed using solution which contains hydrogen or fluorine. A gate insulating layer is formed on the polycrystalline silicon layer and a gate electrode is formed on the gate insulating layer. A source/drain domain is formed in both sides of the gate electrode. An inter layer insulating layer is formed on the gate insulating layer and the gate electrode. A source/drain electrode touches with the source/drain domain by passing through the inter layer insulating layer.
申请公布号 KR20110132808(A) 申请公布日期 2011.12.09
申请号 KR20100052353 申请日期 2010.06.03
申请人 SAMSUNG MOBILE DISPLAY CO., LTD. 发明人 CHUNG, YUN MO;LEE, KI YONG;SEO, JIN WOOK;JEONG, MIN JAE;SON, YONG DUCK;SO, BYUNG SOO;PARK, SEUNG KYU;PARK, BYOUNG KEON;LEE, DONG HYUN;LEE, KIL WON;LEE, TAK YOUNG;PARK, JONG RYUK
分类号 H01L21/20;H01L21/324;H01L29/786 主分类号 H01L21/20
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