发明名称 COMPOUND FOR PHOTOACID GENERATOR, RESIST COMPOSITION USING THE SAME, AND PATTERN-FORMING METHOD
摘要 <p>A sulfonic acid onium salt represented by the following formula (1) can be used as a superior radiosensitive acid generator for resist compositions. It is possible to form a good pattern by using a resist composition containing this sulfonic acid onium salt. In formula (1), R1 represents a monovalent organic group, and Q+ represents a sulfonium cation or iodonium cation.</p>
申请公布号 KR20110133065(A) 申请公布日期 2011.12.09
申请号 KR20117028201 申请日期 2008.02.14
申请人 CENTRAL GLASS COMPANY, LIMITED 发明人 HAGIWARA YUJI;JODRY JONATHAN JOACHIM;NARIZUKA SATORU;MAEDA KAZUHIKO
分类号 C07C309/27;C07C381/12;C08F20/24;G03F7/004 主分类号 C07C309/27
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