发明名称 TEST SYSTEM AND HIGH VOLTAGE MEASUREMENT METHOD
摘要 Provided are a test system and a related high voltage measurement method. The method includes applying an external voltage signal to one or more of a plurality of DUTs via the shared channel, comparing the external voltage signal with a high voltage signal internally generated by the one or more DUTs and generating a corresponding comparison result, and determining a voltage level for each respective high voltage signal in accordance with the comparison result.
申请公布号 US2011299332(A1) 申请公布日期 2011.12.08
申请号 US201113209500 申请日期 2011.08.15
申请人 ZHANG PYUNG-MOON;LEE JIN-YUB;SAMSUNG ELECTRONICS CO., LTD. 发明人 ZHANG PYUNG-MOON;LEE JIN-YUB
分类号 G11C16/10 主分类号 G11C16/10
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