发明名称 |
TEST SYSTEM AND HIGH VOLTAGE MEASUREMENT METHOD |
摘要 |
Provided are a test system and a related high voltage measurement method. The method includes applying an external voltage signal to one or more of a plurality of DUTs via the shared channel, comparing the external voltage signal with a high voltage signal internally generated by the one or more DUTs and generating a corresponding comparison result, and determining a voltage level for each respective high voltage signal in accordance with the comparison result.
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申请公布号 |
US2011299332(A1) |
申请公布日期 |
2011.12.08 |
申请号 |
US201113209500 |
申请日期 |
2011.08.15 |
申请人 |
ZHANG PYUNG-MOON;LEE JIN-YUB;SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
ZHANG PYUNG-MOON;LEE JIN-YUB |
分类号 |
G11C16/10 |
主分类号 |
G11C16/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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