发明名称 CONFIGURABLE TEST SUITE
摘要 A system and method for testing a control module includes a microprocessor, where the microprocessor has a programming environment. The programming environment has a test data structure, a configuration data structure, and a monitor data structure each containing data. At least one test data instance is associated with the test data structure and at least one configuration data instance is associated with the configuration data structure. The configuration data instance is a diagnostic test that monitors a parameter of the microprocessor, and the monitor data structure creates the test data instance such that each test data instance corresponds to one of the configuration data instances. The program includes a first control logic for associating the test data structure, the configuration data structure and the monitor data structure as part of a core infrastructure portion of the programming environment, where the core infrastructure portion of the program is static.
申请公布号 US2011302472(A1) 申请公布日期 2011.12.08
申请号 US20100794398 申请日期 2010.06.04
申请人 VAN EIKEMA HOMMES ONNO R.;SCHUPBACH RICHARD L.;THOMAS JAMES K.;GM GLOBAL TECHNOLOGY OPERATIONS, INC. 发明人 VAN EIKEMA HOMMES ONNO R.;SCHUPBACH RICHARD L.;THOMAS JAMES K.
分类号 G06F11/22;G06F11/00 主分类号 G06F11/22
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