发明名称 SELF-ALIGNED CONTACT FOR TRENCH MOSFET
摘要 The process methods and structures mentioned above for creating a trench MOSFET enables self-aligned contacts to be formed to allow decreasing pitch size for trench MOSFET. The self-aligned contacts are formed by etching exposed silicon areas without using lithographical mask and alignment. As a result, the allowance for alignment can be saved and the pitch size can be decreased.
申请公布号 US2011298045(A1) 申请公布日期 2011.12.08
申请号 US20100792025 申请日期 2010.06.02
申请人 KALNITSKY ALEX;TUAN HSIAO-CHIN;WU KUO-MING;HUANG WEI TSUNG 发明人 KALNITSKY ALEX;TUAN HSIAO-CHIN;WU KUO-MING;HUANG WEI TSUNG
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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