| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a jitter analysis method and a test measurement instrument for decomposing and analyzing jitter components using a spectrum analysis and a time-domain probability density. <P>SOLUTION: In the jitter analysis method, a data pattern associated with a waveform from an input terminal 110 is fetched and stored in a memory 125. A controller 135 compares edge locations of the data pattern with a timing reference to collect time interval error values corresponding to a composite jitter of the waveform. A jitter decomposition module 140 in the controller decomposes the composite jitter into jitter components that are correlated to the data pattern and jitter components that are uncorrelated to the data pattern, and furthermore, using a spectrum approach, decomposes the jitter components that are uncorrelated to the data pattern into jitter components that are recognizable as periodic and jitter components that are unrecognizable as periodic. The jitter components are converted into a time domain for the jitter components that are correlated to the data pattern and the recognizably periodic jitter components to be subtracted from the composite jitter, and thereby uncorrelated residual jitter is isolated. The uncorrelated residual jitter is decomposed into bounded uncorrelated jitter and random jitter. <P>COPYRIGHT: (C)2012,JPO&INPIT |
