COMMUNICATION TESTING CIRCUIT, ELECTRONIC DEVICE, RECEIVING CIRCUIT, TRANSMITTING CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, AND WAFER

摘要

Provided is a communication testing circuit that includes a transmitting unit including a spread spectrum clock generator that generates a modulated clock signal by modulating a reference clock signal, a pseudo-random binary sequence generator that generates a pseudo-random pattern, and a signal generator that generates a transmission signal by modulating the pseudo-random pattern based on the modulated clock signal, a receiving unit including a clock and data recovery circuit that receives the transmission signal and recovers the pseudo-random pattern from the transmission signal, and a detector that compares the recovered pseudo-random pattern with a preset pseudo-random pattern and outputs a signal indicating error information, and a control unit that counts a number of errors from the signal indicating error information input from the receiving unit and decides a timing margin based on a counting result.