发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device without needing to form a mask pattern covering only a part of a trench, by using a photoresist film. <P>SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a first trench 7 in a semiconductor substrate 1; forming a first insulator film 8 in the first trench 7; filling the first trench 7 with a first conductive film 9 so that a top surface of the first conductive film 9 is below a top edge of the first insulator film; forming a carbon film 10 on a side surface of the first trench 7; filling the first trench 7 with a second insulator film 11; removing the carbon film 10 that covers one side surface of the first trench 7 to expose a part of the first insulator film 8; and removing the second insulator film 11 and the exposed first insulator film 8 to expose a part of the semiconductor substrate 1. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2011249396(A) |
申请公布日期 |
2011.12.08 |
申请号 |
JP20100118294 |
申请日期 |
2010.05.24 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
MUNETAKA YUKI;HIROTA TOSHIYUKI;UEDA YASUHIKO |
分类号 |
H01L21/8242;H01L21/336;H01L27/108;H01L29/78 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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