发明名称 PROCESS AND DEVICE FOR MEASURING THE THICKNESS OF A COATING LAYER ON A RUNNING STRIP.
摘要 Process and device for measuring the thickness of a layer of coating material of a running strip according to which a quantity representative of the thickness of the coating layer is measured, using an eddy-current sensor, for at least one region of the strip, and the thickness of the coating layer is determined using the measured quantity and at least one calibration value. The measurement made using an eddy-current sensor comprises measuring the complex impedance of a coil facing the running strip for a low-frequency excitation and a high-frequency excitation and the calculation of a quantity representative of the thickness of the coating layer using said complex-impedance measurements. Device for implementing the process and coating plant equipped with the device.
申请公布号 WO2011151585(A2) 申请公布日期 2011.12.08
申请号 WO2011FR51232 申请日期 2011.05.30
申请人 ARCELORMITTAL INVESTIGACION Y DESARROLLO, S.L.;GAUJE, PIERRE 发明人 GAUJE, PIERRE
分类号 G01B15/02;G01B7/06 主分类号 G01B15/02
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