发明名称 ANALYSIS DEVICE AND MANUFACTURING METHOD FOR SAME
摘要 <p>In order to analyse a target quickly and at low cost: a recess section (2) is formed on a semi conductor substrate (1) by means of deep etching; a sensor section (5), which is an electric field-effect device formed in the recess section (2), has electrical properties which change according to the reactions of a target reagent which has been set in a gate region; pump units (6A, 6B) are formed inside the recess section (2) in order to implement the supply and/or discharge of a fluid which contains the reagent to the sensor section (5); and a cover section (3) is bonded to the semiconductor substrate (1) so as to cover the recess section (2), and is provided with an injection opening and a discharge opening for the fluid relative to the recess section (2).</p>
申请公布号 WO2011152474(A1) 申请公布日期 2011.12.08
申请号 WO2011JP62638 申请日期 2011.06.01
申请人 HIROSHIMA UNIVERSITY;NATIONAL INSTITUTE FOR MATERIALS SCIENCE;SAKAMOTO KENJI;MIYAKE RYO;MURAKAMI YUJI;ISHINO SHOTARO;MIYAHARA YUJI 发明人 SAKAMOTO KENJI;MIYAKE RYO;MURAKAMI YUJI;ISHINO SHOTARO;MIYAHARA YUJI
分类号 G01N27/00;C12M1/00;G01N27/414;G01N27/416 主分类号 G01N27/00
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