发明名称 MEMORY DEVICE TRANSISTORS
摘要 Method and device embodiments are described for fabricating MOSFET transistors in a semiconductor also containing non-volatile floating gate transistors. MOSFET transistor gate dielectric smiling, or bird's beaks, are adjustable by re-oxidation processing. An additional re-oxidation process is performed by opening a poly-silicon layer prior to forming an inter-poly oxide dielectric provided for the floating gate transistors.
申请公布号 US2011298035(A1) 申请公布日期 2011.12.08
申请号 US201113213971 申请日期 2011.08.19
申请人 ARITOME SEIICHI 发明人 ARITOME SEIICHI
分类号 H01L29/788;H01L21/336;H01L29/792 主分类号 H01L29/788
代理机构 代理人
主权项
地址