| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an IC handler that can prevent occurrence of inspection failure due to wear of a guide pin and a guide hole by grasping a wear state of the guide pin and the guide hole in the IC handler that conducts position adjustment by engaging the guide pin and the guide hole when an IC chip is mounted on an inspection socket. <P>SOLUTION: The guide hole 59 is provided to a guide block 54, and the guide pin 69 to be engaged with the guide hole 59 is provided on a tester base 68. An insulation layer 60 is provided to an inner circumferential surface 59a of the guide hole 59. A wear detection device 80 is prepared for measuring a resistance between the guide block 54 and tester base 68 in a state where the guide pin 69 is inserted into the guide hole 59. The wear detection device 80 lights a warning lamp 81 based on a change in the resistance between the guide block 54 and tester base 68. The wear state of the insulation layer 60 can be grasped by the lighting of the warning lamp 81. <P>COPYRIGHT: (C)2012,JPO&INPIT |
